Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfoc...

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Detalhes bibliográficos
Autor principal: Kachkanov, Vyacheslav (author)
Outros Autores: Dolbnya, Igor (author), O'Donnell, Kevin (author), Lorenz, Katharina (author), Pereira, Sergio (author), Watson, Ian (author), Sadler, Thomas (author), Li, Haoning (author), Zubialevich, Vitaly (author), Parbrook, Peter (author)
Formato: article
Idioma:eng
Publicado em: 1000
Assuntos:
ALUMINUM NITRIDE
DIFFRACTION
GAN
Texto completo:http://hdl.handle.net/10773/21052
País:Portugal
Oai:oai:ria.ua.pt:10773/21052

Texto Completo

http://hdl.handle.net/10773/21052

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