Nanostructure development in multicomponent polymer systems characterized by synchrotron X-ray scattering
Modern synchrotron beamlines equipped with two-dimensional detectors and high-flux microfocus devices offer interesting possibilities for polymer characterization. This work presents three synchrotron X-ray studies performed in specific multicomponent polymer systems. In the first study, quantificat...
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Other Authors: | , |
Format: | article |
Language: | eng |
Published: |
2016
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Subjects: | |
Online Access: | http://hdl.handle.net/1822/50153 |
Country: | Portugal |
Oai: | oai:repositorium.sdum.uminho.pt:1822/50153 |