Probing the exciton density of states in semiconductor nanocrystals using integrated photoluminiscence spectroscopy

We present the results of a comparative analysis of the absorption and photoluminescence excitation (PLE) spectra vs. integrated photoluminescence (IPL) measured as a function of the excitation wavelength for a number of samples containing II–VI semiconductor nanocrystals (NCs) produced by different...

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Detalhes bibliográficos
Autor principal: Filonovich, Sergej (author)
Outros Autores: Rakovich, Yury P. (author), Vasilevskiy, Mikhail (author), Artemyev, Mikhail V. (author), Talapin, Dmitrii V. (author), Rogach, Andrey L. (author), Rolo, Anabela G. (author), Gomes, M. J. M. (author)
Formato: article
Idioma:eng
Publicado em: 2002
Assuntos:
UV/Vis spectroscopy
Nanostructure
Exciton
Absorption
Photoluminescence
Semiconductor
Nanocrystals
CdTe
CdSe
CdSe/ZnS core-shell nanocrystals
Nanostmcture
Science & Technology
Texto completo:http://hdl.handle.net/1822/18498
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/18498

Texto Completo

http://hdl.handle.net/1822/18498

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