Costa, M. F. M., & Teixeira, V. M. P. (2011). Residual stress measurement in PVD optical coatings by microtopography.
Chicago Style (17th ed.) CitationCosta, Manuel F. M., and Vasco M. P. Teixeira. Residual Stress Measurement in PVD Optical Coatings by Microtopography. 2011.
MLA (8th ed.) CitationCosta, Manuel F. M., and Vasco M. P. Teixeira. Residual Stress Measurement in PVD Optical Coatings by Microtopography. 2011.
Warning: These citations may not always be 100% accurate.