Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig
Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accu...
| Main Author: | |
|---|---|
| Other Authors: | , , |
| Format: | article |
| Language: | por |
| Published: |
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10174/10600 |
| Country: | Portugal |
| Oai: | oai:dspace.uevora.pt:10174/10600 |
| Summary: | Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum. |
|---|