Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig
Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accu...
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| Outros Autores: | , , |
| Formato: | article |
| Idioma: | por |
| Publicado em: |
2014
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10174/10600 |
| País: | Portugal |
| Oai: | oai:dspace.uevora.pt:10174/10600 |