Effects of the ESD protections in the behaviour of a 2.4 GHz RF transceiver: problems and solutions

This paper identifies the main problems related to the Electrostatic Discharge (ESD) in submicron CMOS processes. The mitigation of this problem is made with the use of protections, in order to avoid the destruction of the internal and nput/output circuits connected to the bondingpads. In the 2.4 GH...

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Detalhes bibliográficos
Autor principal: Carmo, João Paulo Pereira (author)
Outros Autores: Mendes, P.M. (author), Ribeiro, Fernando (author), Correia, Jose (author)
Formato: conferenceObject
Idioma:eng
Publicado em: 2008
Assuntos:
RF CMOS transceiver
ESD protections
Microsystem
Measurements
Microwaves
STUB
Texto completo:http://hdl.handle.net/10198/887
País:Portugal
Oai:oai:bibliotecadigital.ipb.pt:10198/887

Texto Completo

http://hdl.handle.net/10198/887

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