A comparative analysis of fault injection methods via enhanced on-chip debug infrastructures
On-chip debug (OCD) features are frequently available in modern microprocessors. Their contribution to shorten the time-to-market justifies the industry investment in this area, where a number of competing or complementary proposals are available or under development, e.g. NEXUS, CJTAG, IJTAG. The c...
| Autor principal: | |
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| Outros Autores: | , , |
| Formato: | book |
| Idioma: | eng |
| Publicado em: |
2008
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| Assuntos: | |
| Texto completo: | https://hdl.handle.net/10216/84662 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/84662 |