Electrochemical Characterization of the Influence of Scanning Number on the Self-assembled Monolayer Formed by Schiff Base
The influence of potential-scan number on the Schiff base self-assembled monolayer was probed by the Cyclic Voltammetry (CV) and Electrochemical Impedance Spectroscopy (EIS) techniques for the first time. The results showed that the charge transferring resistance (Rct) could be reduced with the pote...
| Autor principal: | |
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| Outros Autores: | , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2003
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| Assuntos: | |
| Texto completo: | http://scielo.pt/scielo.php?script=sci_arttext&pid=S0872-19042003000300003 |
| País: | Portugal |
| Oai: | oai:scielo:S0872-19042003000300003 |