Investigations of p-type signal for ZnO thin films grown on (100) GaAs substrates by pulsed laser deposition

In this work we investigated ZnO films grown on semi-insulating (100) GaAs substrates by pulsed laser deposition. Samples were studied using techniques including X-ray diffraction (XRD), scanning electron microscopy, atomic force microscopy, Raman spectroscopy, temperature dependent photoluminescenc...

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Detalhes bibliográficos
Autor principal: Rogers, D.J. (author)
Outros Autores: Teherani, F.H. (author), Monteiro, T. (author), Soares, M. (author), Neves, A. (author), Carmo, M. (author), Pereira, S. (author), Correia, M.R. (author), Lusson, A. (author), Alves, E. (author), Barradas, N.P. (author), Morrod, J.K. (author), Prior, K.A. (author), Kung, P. (author), Yasan, A. (author), Razeghi, M. (author)
Formato: conferenceObject
Idioma:eng
Publicado em: 1000
Assuntos:
Growth (materials)
Pulsed laser deposition
Scanning electron microscopy
Semiconducting gallium compounds
Substrates
X ray diffraction analysis
Zinc oxide
Texto completo:http://hdl.handle.net/10773/6727
País:Portugal
Oai:oai:ria.ua.pt:10773/6727

Texto Completo

http://hdl.handle.net/10773/6727

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