On the convergence to critical scaling profiles in submonolayer deposition models
In this work we study the rate of convergence to similarity profiles in a mean field model for the deposition of a submonolayer of atoms in a crystal facet, when there is a critical minimal size $n\geq 2$ for the stability of the formed clusters. The work complements recently published related resul...
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| Outros Autores: | , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2019
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10400.2/7805 |
| País: | Portugal |
| Oai: | oai:repositorioaberto.uab.pt:10400.2/7805 |