Imprint effect in PZT thin films at compositions around the morphotropic phase boundary

Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for t...

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Detalhes bibliográficos
Autor principal: Araujo, E. B. (author)
Outros Autores: Lima, E. C. (author), Bdikin, I. K. (author), Kholkin, A. L. (author)
Formato: article
Idioma:eng
Publicado em: 1000
Assuntos:
Texto completo:http://hdl.handle.net/10773/19762
País:Portugal
Oai:oai:ria.ua.pt:10773/19762