Debug and test of microcontroller-based applications using the boundary scan test infrastructure
Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost d...
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| Other Authors: | , , |
| Format: | book |
| Language: | eng |
| Published: |
1997
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10216/84455 |
| Country: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/84455 |
| Summary: | Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost debug tool that uses the Boundary Scan Test infrastructure to implement the basic functionality provided by an In-circuit emulator and a logic analyser is a possible solution to overcome this economical problem. To reduce costs the Boundary Scan Test infrastructure is controlled through the parallel port of a normal Personal Computer, now widely available in classrooms. |
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