Debug and test of microcontroller-based applications using the boundary scan test infrastructure
Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost d...
| Autor principal: | |
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| Outros Autores: | , , |
| Formato: | book |
| Idioma: | eng |
| Publicado em: |
1997
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| Assuntos: | |
| Texto completo: | https://hdl.handle.net/10216/84455 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/84455 |