Effect of the matrix on the 1.5 μm photoluminescence of Er-doped silicon quantum dots

Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite s...

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Bibliographic Details
Main Author: Cerqueira, M.F. (author)
Other Authors: Stepikhova, M. (author), Losurdo, M. (author), Monteiro, T. (author), Soares, M.J. (author), Peres, M. (author), Neves, A. (author), Alves, E. (author)
Format: article
Language:eng
Published: 2012
Subjects:
Ellipsometry
Photoluminescence
Silicon QD
Structure
Online Access:http://hdl.handle.net/10773/6636
Country:Portugal
Oai:oai:ria.ua.pt:10773/6636

Internet

http://hdl.handle.net/10773/6636

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