Effect of the matrix on the 1.5 μm photoluminescence of Er-doped silicon quantum dots
Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite s...
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| Outros Autores: | , , , , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2012
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10773/6636 |
| País: | Portugal |
| Oai: | oai:ria.ua.pt:10773/6636 |