Structure and optical properties of ZnO:V thin films with different doping concentration
A series of ZnO thin films doped with various vanadium concentrations were prepared on glass substrates by direct current reactive magnetron sputtering. The results of the X-ray diffraction (XRD) show that the films with doping concentration less than 10 at.% have a wurtzite structure and grow mainl...
| Autor principal: | |
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| Outros Autores: | , , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2009
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/1822/13627 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/13627 |