Exploring combined dark and bright field illumination to improve the detection of defects on specular surfaces

An automatic optical inspection system for detecting local defects on specular surfaces is presented. The system uses an image display to produce a sequence of structured diffuse illumination patterns and a digital camera to acquire the corresponding sequence of images. An image enhancement algorith...

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Detalhes bibliográficos
Autor principal: Forte, Paulo M. F. (author)
Outros Autores: Felgueiras, Paulo Eduardo Reis (author), Ferreira, Flávio Pedro Gonçalves Fernandes (author), Sousa, M. A. (author), Pereira, Eduardo J. Nunes (author), Bret, Boris P. J. (author), Belsley, M. (author)
Formato: article
Idioma:eng
Publicado em: 2017
Assuntos:
Defect detection
Specular surfaces
Automatic optical inspection
Bright-field illumination
Dark-field illumination
Structured light
Science & Technology
Texto completo:http://hdl.handle.net/1822/48273
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/48273

Texto Completo

http://hdl.handle.net/1822/48273

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