Multi-dimensional modelling of electrostatic forces between atomic force microscopy tip and dielectric surface
In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor...
| Autor principal: | |
|---|---|
| Outros Autores: | , , , |
| Formato: | conferencePaper |
| Idioma: | eng |
| Publicado em: |
2013
|
| Assuntos: | |
| Texto completo: | http://hdl.handle.net/1822/27450 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/27450 |