Multi-dimensional modelling of electrostatic forces between atomic force microscopy tip and dielectric surface

In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor...

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Bibliographic Details
Main Author: Boularas, A. (author)
Other Authors: Baudouin, F. (author), Teyssedre, Gilles (author), Villeneuve-Faure, C. (author), Clain, Stéphane (author)
Format: conferencePaper
Language:eng
Published: 2013
Subjects:
Dielectric
Modeling
Finite volume
Microscopy
AFM
electrostatic force
finite volume method (FVM)
Polynomial reconstruction operator (PRO)
dielectric material
Science & Technology
Online Access:http://hdl.handle.net/1822/27450
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/27450

Internet

http://hdl.handle.net/1822/27450

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