Im2Cr: An efficient tool for crystallographic indexing of HR(S)TEM images

Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) have been widely used to characterize nanostructured materials with atomic resolution, and significant advances on their experimental setup greatly extended the current pool of analysis possibilities at the nanoscale. The exploration of...

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Detalhes bibliográficos
Autor principal: Silva, André (author)
Outros Autores: Carbó-Argibay, Enrique (author), Proença, Alberto José (author), Stroppa, Daniel (author)
Formato: conferenceObject
Idioma:eng
Publicado em: 2016
Assuntos:
software tool
crystallographic indexing
nanostructured materials
Engenharia e Tecnologia::Engenharia Eletrotécnica, Eletrónica e Informática
Texto completo:http://hdl.handle.net/1822/53149
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/53149

Texto Completo

http://hdl.handle.net/1822/53149

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