Im2Cr: An efficient tool for crystallographic indexing of HR(S)TEM images
Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) have been widely used to characterize nanostructured materials with atomic resolution, and significant advances on their experimental setup greatly extended the current pool of analysis possibilities at the nanoscale. The exploration of...
Main Author: | |
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Other Authors: | , , |
Format: | conferenceObject |
Language: | eng |
Published: |
2016
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Subjects: | |
Online Access: | http://hdl.handle.net/1822/53149 |
Country: | Portugal |
Oai: | oai:repositorium.sdum.uminho.pt:1822/53149 |