Reductive nanometric patterning of graphene oxide paper using electron beam lithography

Electron beam lithography (EBL) was used for preparing nanostructured reduced patterns on the GO paper surface, while preserving its mechanical resistance and flexibility. Different EBL parameters, like dose and time of exposure for patterning were tested. SEM analysis showed the consequent increase...

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Detalhes bibliográficos
Autor principal: Gonçalves, Gil (author)
Outros Autores: Borme, Jérôme (author), Bdkin, Igor (author), González-Mayorga, Ankor (author), Irurueta, Gonzalo (author), Nogueira, Helena I.S. (author), Serrano, María C. (author), Alpuim, P. (author), Marques, Paula A.A.P. (author)
Formato: article
Idioma:eng
Publicado em: 2018
Assuntos:
Texto completo:http://hdl.handle.net/1822/48558
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/48558