Automatic optical inspection of regular grid patterns with an inspection camera used below the Shannon-Nyquist criterion for optical resolution

An Automatic Optical Inspection (AOI) system for optical inspection of imaging devices used in automotive industry using an inspecting optics of lower spatial resolution than the device under inspection is described. This system is robust and with no moving parts. The cycle time is small. Its main a...

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Bibliographic Details
Main Author: Ferreira, Flávio Pedro Gonçalves Fernandes (author)
Other Authors: Forte, Paulo M. F. (author), Felgueiras, Paulo Eduardo Reis (author), Bret, Boris P. J. (author), Belsley, M. (author), Nunes-Pereira, Eduardo J. (author)
Format: conferencePaper
Language:eng
Published: 2017
Subjects:
Automatic Optical Inspection
AOI
Shannon-Nyquist
Quality Control
Optical Metrology
fractional defects
Science & Technology
Online Access:http://hdl.handle.net/1822/48121
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/48121

Internet

http://hdl.handle.net/1822/48121

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