Automatic optical inspection of regular grid patterns with an inspection camera used below the Shannon-Nyquist criterion for optical resolution

An Automatic Optical Inspection (AOI) system for optical inspection of imaging devices used in automotive industry using an inspecting optics of lower spatial resolution than the device under inspection is described. This system is robust and with no moving parts. The cycle time is small. Its main a...

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Detalhes bibliográficos
Autor principal: Ferreira, Flávio Pedro Gonçalves Fernandes (author)
Outros Autores: Forte, Paulo M. F. (author), Felgueiras, Paulo Eduardo Reis (author), Bret, Boris P. J. (author), Belsley, M. (author), Nunes-Pereira, Eduardo J. (author)
Formato: conferencePaper
Idioma:eng
Publicado em: 2017
Assuntos:
Automatic Optical Inspection
AOI
Shannon-Nyquist
Quality Control
Optical Metrology
fractional defects
Science & Technology
Texto completo:http://hdl.handle.net/1822/48121
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/48121

Texto Completo

http://hdl.handle.net/1822/48121

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