In-Depth X-Ray Photoelectron Spectroscopy of Resistive Switching Devices

This work has explored the possibility of using x-ray photoelectron spectroscopy (XPS), for studying the chemical properties (i.e. atomic ratios and oxidation states) of several metal-insulator-metal (MIM) structures. This thesis aims to better understand the operation mechanism that imposes a rever...

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Bibliographic Details
Main Author: Narciso, Gonçalo Filipe Fernandes (author)
Format: masterThesis
Language:eng
Published: 2020
Subjects:
X-rap photoelectron spectroscopy
resistive switching
depth profiling
diode
Domínio/Área Científica::Engenharia e Tecnologia::Nanotecnologia
Online Access:http://hdl.handle.net/10362/99347
Country:Portugal
Oai:oai:run.unl.pt:10362/99347

Internet

http://hdl.handle.net/10362/99347

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