Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films

Nanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively...

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Bibliographic Details
Main Author: Cerqueira, M.F. (author)
Other Authors: Stepikhova, M. (author), Losurdo, M. (author), Giangregorio, M.M. (author), Alves, E. (author), Monteiro, T. (author), Soares, M.J. (author), Boemare, C. (author)
Format: article
Language:eng
Published: 1000
Subjects:
Nanocrystalline silicon
Spectroscopic ellipsometry
X-ray diffractometry
Online Access:http://hdl.handle.net/10773/6483
Country:Portugal
Oai:oai:ria.ua.pt:10773/6483

Internet

http://hdl.handle.net/10773/6483

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