Dynamically rotate and free for test: the aath for FPGA concurrent test
Dynamically reconfigurable systems have benefited from a new class of FPGAs, recently introduced into the market, that enables partial and dynamic reconfiguration.While enabling concurrent reconfiguration without disturbing the system operation, this technology also raises a new test challenge: to a...
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| Outros Autores: | , |
| Formato: | book |
| Idioma: | eng |
| Publicado em: |
2001
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| Texto completo: | https://repositorio-aberto.up.pt/handle/10216/85031 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/85031 |