Inkjet-printed organic electronics: Operational stability and reliability issues

The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause t...

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Bibliographic Details
Main Author: Medeiros, M. C. R. (author)
Other Authors: Martinez Domingo, C. (author), Ramon, E. (author), Negrier, A. T. (author), Sowade, E. (author), Mitra, K. Y. (author), Baumann, R. R. (author), McCulloch, I. (author), Carrabina, J. (author), Gomes, Henrique L. (author)
Format: conferenceObject
Language:eng
Published: 2015
Online Access:http://hdl.handle.net/10400.1/6628
Country:Portugal
Oai:oai:sapientia.ualg.pt:10400.1/6628
Description
Summary:The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.

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