3D modelling of electrostatic force distance curve between the AFM probe and dielectric surface
Techniques derived from the near-field microscopies and particularly the Atomic Force Microscopy (AFM) are presented as alternative techniques for measurement of space charge compared to classical techniques due to their high sensitivity to the electrostatic force and a better resolution (≈ nm). One...
| Autor principal: | |
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| Outros Autores: | , , , |
| Formato: | conferencePaper |
| Idioma: | eng |
| Publicado em: |
2014
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/1822/32351 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/32351 |