Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films

Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt/TiO2/SiO2/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends...

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Detalhes bibliográficos
Autor principal: Melo, M. (author)
Outros Autores: Araujo, E. B. (author), Shvartsman, V. V. (author), Shur, V. Ya. (author), Kholkin, A. L. (author)
Formato: article
Idioma:eng
Publicado em: 2017
Assuntos:
FORCE MICROSCOPY
PIEZOELECTRIC PROPERTIES
RIETVELD REFINEMENT
PLZT
CERAMICS
DIFFRACTION
DISORDER
BEHAVIOR
STRESS
STATE
Texto completo:http://hdl.handle.net/10773/19866
País:Portugal
Oai:oai:ria.ua.pt:10773/19866

Texto Completo

http://hdl.handle.net/10773/19866

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