Pinho, B. D. V. d. (2018). Advanced technics of automatic inspection based on x-ray and image processing.
Citação norma ChicagoPinho, Bruno Daniel Vieira de. Advanced Technics of Automatic Inspection Based on X-ray and Image Processing. 2018.
Citação norma MLAPinho, Bruno Daniel Vieira de. Advanced Technics of Automatic Inspection Based on X-ray and Image Processing. 2018.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.