Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples

Dissertation to obtain a Master degree in Biotechnology

Detalhes bibliográficos
Autor principal: Calmeiro, Tomás R. (author)
Formato: masterThesis
Idioma:eng
Publicado em: 2013
Assuntos:
Atomic force microscopy
AFM
Bionanotechnology
DNA-protein interaction
AFM probe modifications
Focused ion beam
Texto completo:http://hdl.handle.net/10362/10851
País:Portugal
Oai:oai:run.unl.pt:10362/10851

Texto Completo

http://hdl.handle.net/10362/10851

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