Ion beam monitoring over a biased target
A specially designed beam profile monitor (BPM) was produced to be assembled over a biased target plate, with the aim of studying the effect of an ion beam deceleration system on the beam fluence due to beam dispersion. The new BPM was developed with a shape as flat as possible, so it could be attac...
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| Other Authors: | , , |
| Format: | conferenceObject |
| Language: | eng |
| Published: |
2017
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| Subjects: | |
| Online Access: | http://hdl.handle.net/10400.21/7538 |
| Country: | Portugal |
| Oai: | oai:repositorio.ipl.pt:10400.21/7538 |