Ion beam monitoring over a biased target
A specially designed beam profile monitor (BPM) was produced to be assembled over a biased target plate, with the aim of studying the effect of an ion beam deceleration system on the beam fluence due to beam dispersion. The new BPM was developed with a shape as flat as possible, so it could be attac...
| Autor principal: | |
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| Outros Autores: | , , |
| Formato: | conferenceObject |
| Idioma: | eng |
| Publicado em: |
2017
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10400.21/7538 |
| País: | Portugal |
| Oai: | oai:repositorio.ipl.pt:10400.21/7538 |