APA (7th ed.) Citation

Vieira, E. M. F., Diaz, R., Grisolia, J., Parisini, A., Martín-Sánchez, J., Levichev, S., . . . Gomes, M. J. M. (2013). Charge trapping properties and retention time in amorphous SiGe/SiO2 nanolayers.

Chicago Style (17th ed.) Citation

Vieira, E. M. F., Regis Diaz, Jeremie Grisolia, Andrea Parisini, J. Martín-Sánchez, S. Levichev, Anabela G. Rolo, A. Chahboun, and M. J. M. Gomes. Charge Trapping Properties and Retention Time in Amorphous SiGe/SiO2 Nanolayers. 2013.

MLA (8th ed.) Citation

Vieira, E. M. F., et al. Charge Trapping Properties and Retention Time in Amorphous SiGe/SiO2 Nanolayers. 2013.