Structural and optical properties of nitrogen doped ZnO films

In this study we discuss the structural and optical properties of ZnO films doped with nitrogen, a potential p-type dopant. The films were deposited by magnetron sputtering using different conditions and substrates. The composition and structural properties of the films were studied combining X-ray...

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Bibliographic Details
Main Author: Alves, E. (author)
Other Authors: Franco, N. (author), Barradas, N.P. (author), Munnik, F. (author), Monteiro, T. (author), Peres, M. (author), Wang, J. (author), Martins, R. (author), Fortunato, E. (author)
Format: article
Language:eng
Published: 1000
Subjects:
Online Access:http://hdl.handle.net/10773/6084
Country:Portugal
Oai:oai:ria.ua.pt:10773/6084
Description
Summary:In this study we discuss the structural and optical properties of ZnO films doped with nitrogen, a potential p-type dopant. The films were deposited by magnetron sputtering using different conditions and substrates. The composition and structural properties of the films were studied combining X-ray diffraction (XRD), Rutherford backscattering (RBS), and heavy ion elastic recoil detection analysis (HI-ERDA). The results show an improvement of the quality of the films deposited on sapphire with increasing radio-frequency (RF) power with a preferentially growth along the c-axis. The ERDA analysis reveals the presence of H in the films and a homogeneous composition over the entire thickness. The photoluminescence of annealed samples evidences an improvement on the optical quality as identified by the well structured near band edge recombination.