Nanoscale polarization relaxation and piezoelectric properties of SBN thin films

Randomly oriented Sr0.75Ba0.25Nb2O6 thin films have been deposited on Pt(111)/Ti/SiO2/Si substrates using a polymeric chemical route to study their peculiar nanopolar structures and local ferroelectric properties using piezoresponse force microscopy (PFM) technique. PFM images reveals grains with co...

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Bibliographic Details
Main Author: Melo, M. (author)
Other Authors: Araujo, E. B. (author), Ivanov, M. (author), Shur, V. Ya. (author), Kholkin, A. L. (author)
Format: article
Language:eng
Published: 1000
Subjects:
STRONTIUM BARIUM NIOBATE
CAPACITORS
Online Access:http://hdl.handle.net/10773/19565
Country:Portugal
Oai:oai:ria.ua.pt:10773/19565

Internet

http://hdl.handle.net/10773/19565

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