The annealing effect on structural and optical properties of ZnO thin films produced by RF sputtering

In this work, a study of the structure and optical properties of undoped ZnO thin films produced by r.f. magnetron sputtering technique as a function of the growth parameters is reported. Modification under annealing conditions is also analysed. Raman spectroscopy, X-ray photoelectron spectroscopy,...

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Bibliographic Details
Main Author: Rolo, Anabela G. (author)
Other Authors: Campos, J. Ayres de (author), Viseu, T. M. R. (author), Arôso, T. de Lacerda (author), Cerqueira, M. F. (author)
Format: article
Language:eng
Published: 2007
Subjects:
ZnO
Thin films
X-ray
Raman
Stress
Science & Technology
Online Access:http://hdl.handle.net/1822/13774
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/13774

Internet

http://hdl.handle.net/1822/13774

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