The visible and near IR photoluminescent response of nc-Si:Er thin films produced by rf sputtering
In this contribution we present the visible and near IR photoluminescence (PL) analysis of Er doped nanocrystalline silicon thin films produced by the rf magnetron sputtering method. Efficient photoluminescence was observed in these structures in both the visible and 1.54 µm wavelength regions. We s...
| Autor principal: | |
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| Outros Autores: | , , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2004
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10773/6174 |
| País: | Portugal |
| Oai: | oai:ria.ua.pt:10773/6174 |