Cerqueira, M. F., Ferreira, J. A., & Adriaenssens, G. J. (2000). Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputtering.
Chicago Style (17th ed.) CitationCerqueira, M. F., J. A. Ferreira, and G. J. Adriaenssens. Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by RF Sputtering. 2000.
MLA (8th ed.) CitationCerqueira, M. F., et al. Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by RF Sputtering. 2000.
Warning: These citations may not always be 100% accurate.