Nanostructure development in multicomponent polymer systems and Its characterization by synchrotron X-ray scattering

Modern synchrotron beamlines equipped with 2D detection and microfocus offer interesting possibilities for polymer characterization. This work presents several synchrotron X-ray studies performed in multicomponent polymer systems, i.e., nanostructure development under controlled strain, quantificati...

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Bibliographic Details
Main Author: Denchev, Z. (author)
Other Authors: Dencheva, Nadya Vasileva (author), Stribeck, A. (author), Roth, S. (author)
Format: conferenceObject
Language:eng
Published: 2015
Subjects:
X-ray scattering
simultaneous WAXS/SAXS
microfocus X-ray scattering
synchrotron radiation
Engenharia e Tecnologia::Engenharia dos Materiais
Online Access:http://hdl.handle.net/1822/53961
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/53961

Internet

http://hdl.handle.net/1822/53961

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