Nanostructure development in multicomponent polymer systems and Its characterization by synchrotron X-ray scattering
Modern synchrotron beamlines equipped with 2D detection and microfocus offer interesting possibilities for polymer characterization. This work presents several synchrotron X-ray studies performed in multicomponent polymer systems, i.e., nanostructure development under controlled strain, quantificati...
| Autor principal: | |
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| Outros Autores: | , , |
| Formato: | conferenceObject |
| Idioma: | eng |
| Publicado em: |
2015
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/1822/53961 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/53961 |