Structural properties of Ge nano-crystals embedded in SiO2 films from X-ray diffraction and Raman spectroscopy

SiO2 films containing small particles of Ge were grown using the r.f.-magnetron sputtering technique. The films were studied by means of X-ray diffraction (XRD) and Raman spectroscopy. XRD studies revealed diamond structure of Ge particles in the films grown at temperatures higher than 500ºC. The de...

Full description

Bibliographic Details
Main Author: Rolo, Anabela G. (author)
Other Authors: Vasilevskiy, Mikhail (author), Conde, O. (author), Gomes, M. J. M. (author)
Format: article
Language:eng
Published: 1998
Subjects:
Germanium
Nanocrystals
r.f.-sputtering
X-ray diffraction
Raman spectroscopy
Science & Technology
Online Access:http://hdl.handle.net/1822/14279
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/14279

Internet

http://hdl.handle.net/1822/14279

Similar Items