Visible and near IR photoluminescent response of nc-Si: er thin films produced by rf sputtering

In this contribution we present the Visible and near IR photoluminescence (PL) analysis of Er doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. Efficient photoluminescence was observed in these structures in both visible and 1.54µm wavelength regions. We show the s...

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Detalhes bibliográficos
Autor principal: Cerqueira, M. F. (author)
Outros Autores: Monteiro, T. (author), Stepikhova, M. (author), Losurdo, M. (author), Soares, M. J. (author), Gomes, I. Tarroso (author)
Formato: article
Idioma:eng
Publicado em: 2004
Assuntos:
Texto completo:http://hdl.handle.net/1822/13952
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/13952