Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films

PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of...

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Bibliographic Details
Main Author: Lima, E. C. (author)
Other Authors: Araujo, E. B. (author), Bdikin, I. K. (author), Kholkin, A. L. (author)
Format: article
Language:eng
Published: 1000
Subjects:
ZIRCONATE-TITANATE FILMS
SELF-POLARIZATION
ELECTRICAL-PROPERTIES
THICKNESS DEPENDENCE
FERROELECTRIC-FILMS
PBZR1-XTIXO3
CAPACITORS
Online Access:http://hdl.handle.net/10773/20477
Country:Portugal
Oai:oai:ria.ua.pt:10773/20477

Internet

http://hdl.handle.net/10773/20477

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