Raman spectra and structural analysis in ZrOxNy thin films
Raman spectroscopy has been used as a local probe to characterize the structural evolution of magnetron-sputtered decorative zirconium oxynitride ZrOxNy films which result from an increase of reactive gas flow in the deposition The lines shapes, the frequency position and widths of the Raman bands s...
| Autor principal: | |
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| Outros Autores: | , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2006
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/1822/5763 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/5763 |