Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Lead zirconate titanate Pb(Zr0.50Ti0.50)O-3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films...

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Bibliographic Details
Main Author: Araujo, E. B. (author)
Other Authors: Lima, E. C. (author), Bdikin, I. K. (author), Kholkin, A. L. (author)
Format: article
Language:eng
Published: 2017
Subjects:
X-RAY-DIFFRACTION
RIETVELD REFINEMENT
PBZR1-XTIXO3 PZT
IMPRINT BEHAVIOR
DEPOSITION
POLARIZATION
PYROCHLORE
CAPACITORS
KINETICS
POWDER
Online Access:http://hdl.handle.net/10773/19888
Country:Portugal
Oai:oai:ria.ua.pt:10773/19888

Internet

http://hdl.handle.net/10773/19888

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