Enhancement of graphene visibility on transparent substrates by refractive index optimization

Optical reflection microscopy is one of the main imaging tools to visualize graphene microstructures. Here is reported a novel method that employs refractive index optimization in an optical reflection microscope, which greatly improves the visibility of graphene flakes. To this end, an immersion li...

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Detalhes bibliográficos
Autor principal: Gonçalves, Hugo (author)
Outros Autores: Alves, Luis (author), Moura, C. (author), Belsley, M. (author), Stauber, Tobias Pascal (author), Schellenberg, Peter Michael (author)
Formato: article
Idioma:eng
Publicado em: 2013
Assuntos:
Graphene
Visibility
Graphene contrast
Graphene absorption
Science & Technology
Texto completo:http://hdl.handle.net/1822/25418
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/25418
Descrição
Resumo:Optical reflection microscopy is one of the main imaging tools to visualize graphene microstructures. Here is reported a novel method that employs refractive index optimization in an optical reflection microscope, which greatly improves the visibility of graphene flakes. To this end, an immersion liquid with a refractive index that is close to that of the glass support is used in-between the microscope lens and the support improving the contrast and resolution of the sample image. Results show that the contrast of single and few layer graphene crystals and structures can be enhanced by a factor of 4 compared to values commonly achieved with transparent substrates using optical reflection microscopy lacking refractive index optimization.

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