Surface AFM microscopy of unworn and worn samples of silicone hydrogel contact lenses
Abstract: Purpose. To evaluate the qualitative and quantitative topographic changes in the surface of worn contact lenses (CLs) of different materials using atomic force microscopy (AFM). Methods. The topography of five different CL materials was evaluated withAFM over a surface of 25 lm2 according...
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| Outros Autores: | , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2009
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| Assuntos: | |
| Texto completo: | https://hdl.handle.net/1822/8565 |
| País: | Portugal |
| Oai: | oai:repositorium.sdum.uminho.pt:1822/8565 |